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Ed Lee
Ed Lee
Ed Lee has been around EDA since before it was called EDA. He cut his teeth doing Public Relations with Valid, Cadence, Mentor, ECAD, VLSI, AMI and a host of others. And he has introduced more than three dozen EDA startups, ranging from the first commercial IP company to the latest statistical … More »

Atrenta’s unified platform

 
May 15th, 2012 by Ed Lee

Maybe Atrenta is saying goodbye to the thought-bubble guy…..

Atrenta’s SpyGlass has always been the dominant name in the company’s brand portfolio,and for good reason. It’s the dominant product in RTL design analysis, verification and optimization.

Now, Atrenta is reconfiguring its product lineup to formalize this state of affairs. SpyGlass now becomes the unifying platform for all Atrenta products.  Sort of the mother ship that all Atrenta products are based on.

So what’s a unified platform? All the tools now share a common set up and debugging methodology and tighter GUI. And what can users verify and optimize from this new unified platform? Syntax, power, testability, clock synchronization, timing and routing congestion. All at the RTL stage, well before detailed implementation begins.

It’s a lot like catching a design error in a house at the blueprint stage, rather than when you’re actually constructing the house.

Of special note to media folks covering DAC, Atrenta is showing:

__a 3D planning and optimization tool which some in the user community call Pathfinding that handles 2.5D silicon interposer designs and heterogeneous 3D stacked die designs.

__an IP quality certification kit ­to check for IP completeness and integration risks before the third party IP block gets handed off. The Atrenta IP Kit also delivers automated regressions and trend analysis for continuous quality improvement.

It’s worth stopping by Atrenta @ DAC to get a look at the new SpyGlass platform configuration and product lineup.  Atrenta is at booth 2230.

——————-

Lee PR does work for Atrenta.

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