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Posts Tagged ‘coverage’

Stress-Relief for Requirements-Based Verification

Wednesday, July 16th, 2014

DO-254-RequirementsIf they’re being honest, anyone who has verified an FPGA under strict DO-254 guidance will tell you that it is stressful. Show me an engineer on their first DO-254 project – and I’ll show you someone pulling out their hair and downing what is probably their 5th cup of coffee while these important questions weigh heavy on their minds:

Have we reviewed all FPGA requirements and validated derived FPGA requirements? Do we have a good record of the review activities?

Do I have a test for each functional FPGA requirement? What’s the status of the tests? How do I track the progress and document the results?

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OS-VVM CoveragePkg, A Detailed Example

Thursday, May 15th, 2014

Alex Grove, FirstEDA Applications Specialist, was kind enough to author a guest blog for Aldec. Here’s an excerpt:

Here in Europe, I recently had the opportunity to work with Jim Lewis, OS-VVM Chief Architect and IEEE 1076 Working Group Chair, on the first Advanced VHDL Testbenches & Verification training course. This training, held in Bracknell, UK, was attended by engineers from several major European system companies who design and verify programmable devices (FPGAs). VHDL is by far the dominate language used by Europe’s system companies for the design and verification of FPGAs, however it is unclear to many how to enhance their verification with VHDL. What I have found is that experienced FPGA design engineers (including myself) are not utilising the VHDL language for verification.

Jim Lewis introduces VHDL’s verification capabilities, including new VHDL 2008 features and the Open Source VHDL Verification Methodology (OSVVM). OSVVM provides a methodology for testbench development and verification packages that provide functional coverage and random value generation. (more…)

Why Randomize?

Tuesday, September 24th, 2013

Jim Lewis, VHDL Training Expert at SynthWorks (and founding member of OSVVM, which Aldec was an early adopter of) was kind enough to author a guest blog for Aldec. Here’s an excerpt:

After presenting a conference paper on how to do OSVVM-style constrained random and intelligent coverage (randomization based on functional coverage holes), I received  a great question, “Why Randomize?”

The easiest way to answer this is with an example.  Let’s look at a FIFO test – test a FIFO, write to it, read from it, write to it and read from it simultaneously, fill it and see that additional writes are held off successfully, and empty it and see that additional reads are held off successfully. 

Most certainly a FIFO can be tested using a directed test (just code, no randomization).  The following simulation waveform shows diffcount (the number of words in the FIFO) for a directed test.   The lowest value is empty.  The highest is full.  Using this, you can visually check off all of the required conditions and see that the FIFO is indeed tested.

For the rest of this article, visit the Aldec Design and Verification Blog.

90’s Kid Active-HDL Celebrates Sweet 16

Wednesday, August 28th, 2013

As the proud Product Manager of Aldec’s  FPGA Design Simulation solution,  I am excited (like it was my first Cranberries concert) to announce that Active-HDL™ is celebrating 16 years since its initial release in 1997. Active-HDL has not merely stood the test of time, it has dominated the FPGA market like a Hulk Hogan smackdown with powerful simulation performance and debugging tools.

The key to Active-HDL’s long-term success lies in Aldec’s customer-centric philosophy. Simply put, we really do listen closely to our users and invest heavily in our tools. For this reason, continued simulation performance optimizations from release to release enable users to benefit from Active-HDL’s faster simulation even as the size of FPGA designs continues to grow.

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