VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series in Systems on Silicon)
by Laung-Terng Wang , Cheng-Wen Wu , Xiaoqing Wen



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Editorial Reviews
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.



Book Details
  • Media : Hardcover
  • Publisher : Morgan Kaufmann (July 21, 2006)
  • Language : English
  • ISBN : 0123705975
  • Amazon.com Sales Rank : # 1,084,294 in Amazon.com Books Sales


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