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 YFL Elite 
Short Desc. : Accelerated Memory-Built-In-Self-Test (AMBIST)
Overview :
AMBIST is a highlight technology of our Total-Self-Test Solutions (TSTS). Most IC products still rely heavily on ATE for testings, which often requires complex multileveled cooperation between many different disciplines or companies; the later case is certainly more common since few design companies today also invest in the own ATE, the cost is simply too high.
Features : - Fully autonomous testing on-chip.
- High quality virtually-random test patterns.
- High quality test response compression.
- Reliable test result signature.
Categories :
Portability :
Type : Soft
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