|The most important factor which most of customers concern for embedded NVM IPs are High reliability, High yield, Test time and Test methodology. These factors can seriously affect the reliability, performance and manufacturing cost of the whole system. Flasys' embedded NVM IPs offer the best solution for customers by fulfilling these critical factors by the inherent robustness of the patented UniFlashTM Technology, which is based on highly reliable 2-transistor cell structure. Silicon data proves very high level of data retention over 100 years. Very high level of yield that will not affect the whole ASIC product yield is silicon proven. Test methodology will be provided and fully shared with customer through technical support by highly experienced Flasys' engineering staff. Test time of Flasys' embedded NVM IPs are one of the industry shortest and this will remarkably reduce the cost burden of customer induced by test time of embedded NVM.