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STMicroelectronics’ Experience: Synopsys Logic BIST for Automotive and Safety-Critical Designs
Date: July 17 - August 13, 2015
Place: CA USA

ICs targeted for safety-critical applications must be able to perform in-system self-test in compliance with functional safety standards such as ISO 26262. In this webinar, Synopsys highlights synthesis-based logic BIST that addresses the self-test requirements for safety-critical designs. Our guest speaker from STMicroelectronics presents results and details of Synopsys’ test solution successfully deployed on production designs. 

Cinzia Bartolommei
Cinzia Bartolommei, senior DFT engineer at STMicroelectronics, is part of CMOS ASIC R&D group of the Digital & Mixed Processes ASIC division, with the mission of defining and developing digital test methodologies for the management of complex, multi-million gate ASIC products. Her current interest and focus are in-system test and scan techniques.

 Adam Cron
Adam Cron is part of the Test Automation Implementation R&D Group and has been with the company for over 17 years. A Syracuse University graduate, Adam has worked in test-related fields at Motorola and Texas Instruments for a total of 30 years in the industry. Adam has worked on many IEEE standards efforts, is currently vice-chair of IEEE Std P1838, and is an IEEE Golden Core recipient.

Chris Allsup
Chris Allsup, Marketing Manager in Synopsys’ synthesis and test group, has more than 20 years combined experience in IC design, field applications, sales, and marketing. He earned a BSEE degree from UC San Diego and an MBA degree from Santa Clara University. Chris has authored numerous articles and papers on design and test.

6th Asia Symposium on Quality Electronic Design
Date: August 3 - 5, 2015
Place: POB 607
Los Altos, CA 94023 USA

ASQED 2015 is the 6th ISQED event organized in Malaysia and is the 29thworldwide event organized by the International Society for Quality Electronic Design with technical sponsorship from several IEEE Societies. This event is being sponsored by MIDA. The conference emphasizes innovations and the latest developments in System and IC Design, Sensors, MEMS & NEMS, Semiconductor Technology & Manufacturing, IC Packaging & PCB Technology, Test, and Bio & Nano Electronics. ASQED 2015 is held with technical sponsorship of IEEE Circuits and Systems Society (CASS) and IEEE Reliability Society. Past ASQED papers have been published in IEEE digital library Xplore and indexed by Scopus. To submit papers please visit:

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