ICs targeted for safety-critical applications must be able to perform in-system self-test in compliance with functional safety standards such as ISO 26262. In this webinar, Synopsys highlights synthesis-based logic BIST that addresses the self-test requirements for safety-critical designs. Our guest speaker from STMicroelectronics presents results and details of Synopsys’ test solution successfully deployed on production designs.
Cinzia Bartolommei, senior DFT engineer at STMicroelectronics, is part of CMOS ASIC R&D group of the Digital & Mixed Processes ASIC division, with the mission of defining and developing digital test methodologies for the management of complex, multi-million gate ASIC products. Her current interest and focus are in-system test and scan techniques.
Adam Cron is part of the Test Automation Implementation R&D Group and has been with the company for over 17 years. A Syracuse University graduate, Adam has worked in test-related fields at Motorola and Texas Instruments for a total of 30 years in the industry. Adam has worked on many IEEE standards efforts, is currently vice-chair of IEEE Std P1838, and is an IEEE Golden Core recipient.
Chris Allsup, Marketing Manager in Synopsys’ synthesis and test group, has more than 20 years combined experience in IC design, field applications, sales, and marketing. He earned a BSEE degree from UC San Diego and an MBA degree from Santa Clara University. Chris has authored numerous articles and papers on design and test.